JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS
Skrót:
J ELECTRON TEST
ISSN:
0923-8174
| Rok | Punkty ministerialne | Impact Factor | Eigenfactor | Article influence |
|---|---|---|---|---|
| 2025 | 40 | |||
| 2024 | 40 | 0.00029 | 0.147 | |
| 2023 | 40 | 0.00036 | 0.174 | |
| 2022 | 40 | 0.00046 | 0.19 | |
| 2021 | 40 | 0.00048 | 0.179 | |
| 2020 | 40 | 0.00058 | 0.208 | |
| 2019 | 40 | 0.00057 | 0.17 | |
| 2018 | 15 | 0.00054 | 0.15 | |
| 2017 | 15 | 0.00066 | 0.166 | |
| 2016 | 15 | 0.00055 | 0.132 | |
| 2015 | 15 | 0.00054 | 0.12 | |
| 2014 | 15 | 0.00061 | 0.143 | |
| 2013 | 15 | 0.00073 | 0.175 | |
| 2012 | 20 | 0.00062 | 0.157 | |
| 2011 | 13 | 0.00076 | 0.202 | |
| 2010 | 13 | 0.00145 | 0.367 | |
| 2009 | 10 | 0.00089 | 0.19 | |
| 2008 | 10 | 0.00071 | 0.139 | |
| 2007 | 0 | 0.00116 | 0.215 |
