JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS
Skrót:
J ELECTRON TEST
ISSN:
0923-8174
Rok | Punkty ministerialne | Impact Factor | Eigenfactor | Article influence |
---|---|---|---|---|
2024 | 40 | |||
2023 | 40 | 0.00036 | 0.174 | |
2022 | 40 | 0.00046 | 0.19 | |
2021 | 40 | 0.00048 | 0.179 | |
2020 | 40 | 0.00058 | 0.208 | |
2019 | 40 | 0.00057 | 0.17 | |
2018 | 15 | 0.00054 | 0.15 | |
2017 | 15 | 0.00066 | 0.166 | |
2016 | 15 | 0.00055 | 0.132 | |
2015 | 15 | 0.00054 | 0.12 | |
2014 | 15 | 0.00061 | 0.143 | |
2013 | 15 | 0.00073 | 0.175 | |
2012 | 20 | 0.00062 | 0.157 | |
2011 | 13 | 0.00076 | 0.202 | |
2010 | 13 | 0.00145 | 0.367 | |
2009 | 10 | 0.00089 | 0.19 | |
2008 | 10 | 0.00071 | 0.139 | |
2007 | 0 | 0.00116 | 0.215 |